Kelvin probe force microscopy in liquid using electrochemical force microscopy

Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of inter...

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Enregistré dans:
Détails bibliographiques
Publié dans:Beilstein J Nanotechnol
Auteurs principaux: Collins, Liam, Jesse, Stephen, Kilpatrick, Jason I, Tselev, Alexander, Okatan, M Baris, Kalinin, Sergei V, Rodriguez, Brian J
Format: Artigo
Langue:Inglês
Publié: Beilstein-Institut 2015
Sujets:
Full Research Paper
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC4311590/
https://ncbi.nlm.nih.gov/pubmed/25671164
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.19
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