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Kelvin probe force microscopy in liquid using electrochemical force microscopy
Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of inter...
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| 出版年: | Beilstein J Nanotechnol |
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| 主要な著者: | , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Beilstein-Institut
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4311590/ https://ncbi.nlm.nih.gov/pubmed/25671164 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.19 |
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