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Kelvin probe force microscopy in liquid using electrochemical force microscopy
Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of inter...
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| Опубликовано в: : | Beilstein J Nanotechnol |
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| Главные авторы: | , , , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Beilstein-Institut
2015
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4311590/ https://ncbi.nlm.nih.gov/pubmed/25671164 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.19 |
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