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Artifacts in time-resolved Kelvin probe force microscopy
Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest. Recently, several techniques for time-resolved measurements with time resolu...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5942368/ https://ncbi.nlm.nih.gov/pubmed/29765805 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.119 |
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