ロード中...
Customized MFM probes with high lateral resolution
Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and...
保存先:
| 出版年: | Beilstein J Nanotechnol |
|---|---|
| 主要な著者: | , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Beilstein-Institut
2016
|
| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4979883/ https://ncbi.nlm.nih.gov/pubmed/27547625 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.100 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|