טוען...
Customized MFM probes with high lateral resolution
Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and...
שמור ב:
| הוצא לאור ב: | Beilstein J Nanotechnol |
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| Main Authors: | , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Beilstein-Institut
2016
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4979883/ https://ncbi.nlm.nih.gov/pubmed/27547625 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.100 |
| תגים: |
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