Lataa...
Customized MFM probes with high lateral resolution
Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and...
Tallennettuna:
| Julkaisussa: | Beilstein J Nanotechnol |
|---|---|
| Päätekijät: | , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Beilstein-Institut
2016
|
| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4979883/ https://ncbi.nlm.nih.gov/pubmed/27547625 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.100 |
| Tagit: |
Lisää tagi
Ei tageja, Lisää ensimmäinen tagi!
|