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Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies
The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differ...
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| Main Authors: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3999761/ https://ncbi.nlm.nih.gov/pubmed/24778949 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.30 |
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