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Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis
Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others a...
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| Udgivet i: | Beilstein J Nanotechnol |
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| Main Authors: | , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Beilstein-Institut
2020
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7082697/ https://ncbi.nlm.nih.gov/pubmed/32215233 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.37 |
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