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Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors
Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad. 21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved anal...
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| 出版年: | J Synchrotron Radiat |
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| 主要な著者: | , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2014
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4861880/ https://ncbi.nlm.nih.gov/pubmed/24971972 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514011163 |
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