Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad. 21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved anal...

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Detaylı Bibliyografya
Yayımlandı:J Synchrotron Radiat
Asıl Yazarlar: Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Moretti Sala, Marco, Al-Zein, Ali, Krisch, Michael, Monaco, Giulio, Huotari, Simo
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: International Union of Crystallography 2014
Konular:
Research Papers
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC4861880/
https://ncbi.nlm.nih.gov/pubmed/24971972
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514011163
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