Carregant...
Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors
Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad. 21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved anal...
Guardat en:
| Publicat a: | J Synchrotron Radiat |
|---|---|
| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2014
|
| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4861880/ https://ncbi.nlm.nih.gov/pubmed/24971972 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514011163 |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|