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General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffract...
Gorde:
| Argitaratua izan da: | IUCrJ |
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| Egile Nagusiak: | , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
International Union of Crystallography
2021
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7793001/ https://ncbi.nlm.nih.gov/pubmed/33520246 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252520014165 |
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