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Atomic layer deposition for fabrication of HfO(2)/Al(2)O(3) thin films with high laser-induced damage thresholds

Previous research on the laser damage resistance of thin films deposited by atomic layer deposition (ALD) is rare. In this work, the ALD process for thin film generation was investigated using different process parameters such as various precursor types and pulse duration. The laser-induced damage t...

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Detalhes bibliográficos
Publicado no:Nanoscale Res Lett
Main Authors: Wei, Yaowei, Pan, Feng, Zhang, Qinghua, Ma, Ping
Formato: Artigo
Idioma:Inglês
Publicado em: Springer US 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4385131/
https://ncbi.nlm.nih.gov/pubmed/25852341
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-0731-8
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