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Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis
Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel imaging technique aimed at high resolution imaging of macromolecules, nanoparticles, and surfaces. MAD-LEEM combines three innovative electron–optical concepts in a single tool: a monochromator, a mir...
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| Main Authors: | , , , , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
American Vacuum Society
2012
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3634312/ https://ncbi.nlm.nih.gov/pubmed/23847748 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1116/1.4764095 |
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