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Depth sectioning with the aberration-corrected scanning transmission electron microscope
The ability to correct the aberrations of the probe-forming lens in the scanning transmission electron microscope provides not only a significant improvement in transverse resolution but in addition brings depth resolution at the nanometer scale. Aberration correction therefore opens up the possibil...
में बचाया:
| मुख्य लेखकों: | , , |
|---|---|
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
National Academy of Sciences
2006
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC1413870/ https://ncbi.nlm.nih.gov/pubmed/16492746 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.0507105103 |
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