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A Novel Low Energy Electron Microscope for DNA Sequencing and Surface Analysis
Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual...
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| Main Authors: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4117835/ https://ncbi.nlm.nih.gov/pubmed/24524867 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2014.01.007 |
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