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A Novel Low Energy Electron Microscope for DNA Sequencing and Surface Analysis

Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual...

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Main Authors: Mankos, M., Shadman, K., Persson, H.H.J., N’Diaye, A.T., Schmid, A.K., Davis, R.W.
Format: Artigo
Jezik:Inglês
Izdano: 2014
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC4117835/
https://ncbi.nlm.nih.gov/pubmed/24524867
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2014.01.007
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