Compensating spherical and chromatic aberrations of ultrafast electron microscopes with laser beams
Aberration correction is crucial for achieving atomic resolution in electron microscopy. While conventional correctors use multipolar electron lenses, our work explores a fundamentally different approach tailored specifically for ultrafast electron microscopes operating in pulsed mode. We propose us...
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| Huvudupphov: | , , |
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| Materialtyp: | Artigo |
| Språk: | Inglês |
| Utgiven: |
American Physical Society
2025-10-01
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| Serie: | Physical Review Research |
| Länkar: | http://doi.org/10.1103/4bkg-rf1q |
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