Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy

In this work, we present an experimental procedure to measure the composition distribution within inhomogeneous SiGe nanostructures. The method is based on the Raman spectra of the nanostructures, quantitatively analyzed through the knowledge of the scattering efficiency of SiGe as a function of com...

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Detaylı Bibliyografya
Asıl Yazarlar: Picco, Andrea, Bonera, Emiliano, Pezzoli, Fabio, Grilli, Emanuele, Schmidt, Oliver G, Isa, Fabio, Cecchi, Stefano, Guzzi, Mario
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Springer 2012
Konular:
Nano Express
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC3534003/
https://ncbi.nlm.nih.gov/pubmed/23171543
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-633
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