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Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy

In this work, we present an experimental procedure to measure the composition distribution within inhomogeneous SiGe nanostructures. The method is based on the Raman spectra of the nanostructures, quantitatively analyzed through the knowledge of the scattering efficiency of SiGe as a function of com...

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Detalhes bibliográficos
Main Authors: Picco, Andrea, Bonera, Emiliano, Pezzoli, Fabio, Grilli, Emanuele, Schmidt, Oliver G, Isa, Fabio, Cecchi, Stefano, Guzzi, Mario
Formato: Artigo
Idioma:Inglês
Publicado em: Springer 2012
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3534003/
https://ncbi.nlm.nih.gov/pubmed/23171543
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-633
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