APA引用形式

Picco, A., Bonera, E., Pezzoli, F., Grilli, E., Schmidt, O. G., Isa, F., . . . Guzzi, M. (2012). Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy. Springer.

シカゴスタイル引用形

Picco, Andrea, Emiliano Bonera, Fabio Pezzoli, Emanuele Grilli, Oliver G. Schmidt, Fabio Isa, Stefano Cecchi, , Mario Guzzi. Composition Profiling of Inhomogeneous SiGe Nanostructures By Raman Spectroscopy. Springer, 2012.

MLA引用形式

Picco, Andrea, et al. Composition Profiling of Inhomogeneous SiGe Nanostructures By Raman Spectroscopy. Springer, 2012.