Picco, A., Bonera, E., Pezzoli, F., Grilli, E., Schmidt, O. G., Isa, F., . . . Guzzi, M. (2012). Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy. Springer.

Picco, Andrea, Emiliano Bonera, Fabio Pezzoli, Emanuele Grilli, Oliver G. Schmidt, Fabio Isa, Stefano Cecchi, and Mario Guzzi. Composition Profiling of Inhomogeneous SiGe Nanostructures By Raman Spectroscopy. Springer, 2012.

Picco, Andrea, et al. Composition Profiling of Inhomogeneous SiGe Nanostructures By Raman Spectroscopy. Springer, 2012.