Structural Analysis of Mo Thin Films on Sapphire Substrates for Epitaxial Growth of AlN
Aluminum nitride (AlN) thin film/molybdenum (Mo) electrode structures are typically required in microelectromechanical system applications. However, the growth of highly crystalline and <i>c</i>-axis-oriented AlN thin films on Mo electrodes remains challenging. In this study, we demonstrate the epit...
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| Principais autores: | , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
MDPI AG
2023-04-01
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| Serier: | Micromachines |
| Fag: | |
| Online adgang: | https://www.mdpi.com/2072-666X/14/5/966 |
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