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Structural Analysis of Mo Thin Films on Sapphire Substrates for Epitaxial Growth of AlN

Aluminum nitride (AlN) thin film/molybdenum (Mo) electrode structures are typically required in microelectromechanical system applications. However, the growth of highly crystalline and <i>c</i>-axis-oriented AlN thin films on Mo electrodes remains challenging. In this study, we demonstrate the epit...

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Bibliografiske detaljer
Principais autores: Jihong Kim, Youngil Kim, Sung-Min Hong
Format: Artigo
Sprog:Inglês
Udgivet: MDPI AG 2023-04-01
Serier:Micromachines
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Online adgang:https://www.mdpi.com/2072-666X/14/5/966
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