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Demonstration of Synaptic Characteristics in VRRAM with TiN Nanocrystals for Neuromorphic System

Abstract To efficiently develop an extremely intensive storage memory, the resistive random‐access memory (RRAM), which operates by producing and rupturing conductive filaments, is essential. However, due to the stochastic nature of filament production, this filamentary type resistive switching has...

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Bibliografiske detaljer
Principais autores: Seyeong Yang, Taegyun Kim, Sunghun Kim, Sungjoon Kim, Tae‐Hyeon Kim, Muhammad Ismail, Chandreswar Mahata, Sungjun Kim, Seongjae Cho
Format: Artigo
Sprog:Inglês
Udgivet: Wiley-VCH 2023-07-01
Serier:Advanced Materials Interfaces
Fag:
Online adgang:https://doi.org/10.1002/admi.202300290
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