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Impact of traps on current-voltage characteristic of n+-n-n+ diode

A model of n+-n-n+ diode is analyzed using analytical and numerical methods. First, it was conducted a phase-plane analysis, which was aimed at further calculations for low and high injection approximations. A numerical method was used to calculate changes of the field, bias and concentration throug...

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Detaylı Bibliyografya
Yazar: P.M. Kruglenko
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: National Academy of Sciences of Ukraine. Institute of Semi conductor physics. 2017-07-01
Seri Bilgileri:Semiconductor Physics, Quantum Electronics & Optoelectronics
Konular:
Online Erişim:http://journal-spqeo.org.ua/n2_2017/P210-216abstr.html
Etiketler: Etiketle
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