An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

Полное описание

Библиографические подробности

Главные авторы:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
Формат:	Artigo
Язык:	Inglês
Опубликовано:	MDPI AG 2026-03-01
Серии:	Sensors
Предметы:	YOLOv8 screen printing defect detection deep learning machine vision
Online-ссылка:	https://www.mdpi.com/1424-8220/26/5/1604
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!