An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

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מידע ביבליוגרפי

Principais autores:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
פורמט:	Artigo
שפה:	Inglês
יצא לאור:	MDPI AG 2026-03-01
סדרה:	Sensors
נושאים:	YOLOv8 screen printing defect detection deep learning machine vision
גישה מקוונת:	https://www.mdpi.com/1424-8220/26/5/1604
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!