An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

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Hlavní autoři:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2026-03-01
Edice:	Sensors
Témata:	YOLOv8 screen printing defect detection deep learning machine vision
On-line přístup:	https://www.mdpi.com/1424-8220/26/5/1604
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!