An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

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Autores principales:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	MDPI AG 2026-03-01
Colección:	Sensors
Materias:	YOLOv8 screen printing defect detection deep learning machine vision
Acceso en línea:	https://www.mdpi.com/1424-8220/26/5/1604
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