An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

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主要な著者:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
フォーマット:	Artigo
言語:	Inglês
出版事項:	MDPI AG 2026-03-01
シリーズ:	Sensors
主題:	YOLOv8 screen printing defect detection deep learning machine vision
オンライン･アクセス:	https://www.mdpi.com/1424-8220/26/5/1604
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