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Optical properties, infrared spectroscopy and photoluminescence at low temperature of LPCVD silicon oxynitride thin films

Low pressure chemical vapor deposition (LPCVD) silicon oxynitride (SiON) films of various compositions between SiO2 and Si3N4 were grown by changing the relative ratio (Ro) of nitrous oxide (N2O) to silane (SiH4) pressures while keeping constant the ammonia (NH4) pressure. The SiON films were deposi...

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Publicat a:Superficies y vacío
Autors principals: Wilfrido Calleja, Elvia Díaz, Concepción Mejía, Arturo Morales, Jesús Carrillo, Mariano Aceves, Gerardo Contreras
Format: Artigo
Idioma:Inglês
Publicat: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 1999
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Accés en línia:https://www.redalyc.org/articulo.oa?id=94200914
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