Spectroscopical analysis of luminescent silicon rich oxide films

Compositional, structural and optical properties of silicon rich oxide (SRO) films containing different silicon excess were investigated using X ray photoelectron spectroscopy (XPS), Raman spectroscopy, energy filtered transmission electron microscopy (EFTEM) and photoluminescence (PL). The XPS-Si2p...

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Bibliografske podrobnosti

izdano v:	Revista Mexicana de Física
Principais autores:	A. Morales, C. Domínguez, J. Barreto, M. Riera, M. Aceves, J.A. Luna, Z. Yu, R. Kiebach
Format:	Artigo
Jezik:	Inglês
Izdano:	Sociedad Mexicana de Física A.C. 2007
Teme:	Física, Astronomía y Matemáticas
Online dostop:	https://www.redalyc.org/articulo.oa?id=57036163067
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