Spectroscopical analysis of luminescent silicon rich oxide films
Compositional, structural and optical properties of silicon rich oxide (SRO) films containing different silicon excess were investigated using X ray photoelectron spectroscopy (XPS), Raman spectroscopy, energy filtered transmission electron microscopy (EFTEM) and photoluminescence (PL). The XPS-Si2p...
Furkejuvvon:
| Publikašuvnnas: | Revista Mexicana de Física |
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| Váldodahkkit: | , , , , , , , |
| Materiálatiipa: | Artigo |
| Giella: | Inglês |
| Almmustuhtton: |
Sociedad Mexicana de Física A.C.
2007
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| Fáttát: | |
| Liŋkkat: | https://www.redalyc.org/articulo.oa?id=57036163067 |
| Fáddágilkorat: |
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