Spectroscopical analysis of luminescent silicon rich oxide films
Compositional, structural and optical properties of silicon rich oxide (SRO) films containing different silicon excess were investigated using X ray photoelectron spectroscopy (XPS), Raman spectroscopy, energy filtered transmission electron microscopy (EFTEM) and photoluminescence (PL). The XPS-Si2p...
Sábháilte in:
| Foilsithe in: | Revista Mexicana de Física |
|---|---|
| Príomhchruthaitheoirí: | , , , , , , , |
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe / Cruthaithe: |
Sociedad Mexicana de Física A.C.
2007
|
| Ábhair: | |
| Rochtain ar líne: | https://www.redalyc.org/articulo.oa?id=57036163067 |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|