A simple de-dembedding method for on-wafer RF CMOS FET using two microstrip lines
This letter deals with the de-embedding of on-wafer CMOS FETs embedded in symmetrical and reciprocals pads. A de-embedding method, that uses a calibrated vector network analyzer and two microstrip lines fabricated on a lossy SiO2 -Si substrate, is introduced. The proposed method not only allows the...
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| Pubblicato in: | Revista Mexicana de Física |
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| Autori principali: | , , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Sociedad Mexicana de Física A.C.
2013
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| Soggetti: | |
| Accesso online: | https://www.redalyc.org/articulo.oa?id=57028306011 |
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