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Design of a JFET and radiation PIN detector integrated on a high resistivity silicon substrate using a high temperature process

In this work, a fabrication process with a PIN diode integrated in a high resistivity silicon wafer is presented. This process uses high temperature thermal treatments to improve the JFET characteristics. Using simulation programs and statistical tools, the contribution of diverse process steps on t...

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Bibliografiske detaljer
Udgivet i:Revista Mexicana de Física
Principais autores: A.T. Medel de Gante, M. Aceves–Mijares, A. Cerdeira
Format: Artigo
Sprog:Inglês
Udgivet: Sociedad Mexicana de Física A.C. 2006
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Online adgang:https://www.redalyc.org/articulo.oa?id=57028295016
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