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Ptychographic X-ray speckle tracking
A method is presented for the measurement of the phase gradient of a wavefront by tracking the relative motion of speckles in projection holograms as a sample is scanned across the wavefront. By removing the need to obtain an undistorted reference image of the sample, this method is suitable for the...
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| Publicado no: | J Appl Crystallogr |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7312131/ https://ncbi.nlm.nih.gov/pubmed/32684891 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720005567 |
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