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Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging a...
Gorde:
| Argitaratua izan da: | J Appl Crystallogr |
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| Egile Nagusiak: | , , , , , , , , , , , , , , , , , , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
International Union of Crystallography
2020
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7401788/ https://ncbi.nlm.nih.gov/pubmed/32788900 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720006925 |
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