Ptychographic X-ray speckle tracking with multi-layer Laue lens systems

The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging a...

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Xehetasun bibliografikoak
Argitaratua izan da:J Appl Crystallogr
Egile Nagusiak: Morgan, Andrew J., Murray, Kevin T., Prasciolu, Mauro, Fleckenstein, Holger, Yefanov, Oleksandr, Villanueva-Perez, Pablo, Mariani, Valerio, Domaracky, Martin, Kuhn, Manuela, Aplin, Steve, Mohacsi, Istvan, Messerschmidt, Marc, Stachnik, Karolina, Du, Yang, Burkhart, Anja, Meents, Alke, Nazaretski, Evgeny, Yan, Hanfei, Huang, Xiaojing, Chu, Yong S., Chapman, Henry N., Bajt, Saša
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2020
Gaiak:
Research Papers
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC7401788/
https://ncbi.nlm.nih.gov/pubmed/32788900
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720006925
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