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X-ray pulse wavefront metrology using speckle tracking
An instrument allowing the quantitative analysis of X-ray pulsed wavefronts is presented and its processing method explained. The system relies on the X-ray speckle tracking principle to accurately measure the phase gradient of the X-ray beam from which beam optical aberrations can be deduced. The k...
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| Publicado no: | J Synchrotron Radiat |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2015
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4787027/ https://ncbi.nlm.nih.gov/pubmed/26134791 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515005433 |
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