Atomic-Resolution EDX, HAADF, and EELS Study of GaAs(1-x)Bi(x) Alloys

The distribution of alloyed atoms in semiconductors often deviates from a random distribution which can have significant effects on the properties of the materials. In this study, scanning transmission electron microscopy techniques are employed to analyze the distribution of Bi in several distinctl...

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Detaylı Bibliyografya
Yayımlandı:Nanoscale Res Lett
Asıl Yazarlar: Paulauskas, Tadas, Pačebutas, Vaidas, Butkutė, Renata, Čechavičius, Bronislovas, Naujokaitis, Arnas, Kamarauskas, Mindaugas, Skapas, Martynas, Devenson, Jan, Čaplovičová, Mária, Vretenár, Viliam, Li, Xiaoyan, Kociak, Mathieu, Krotkus, Arūnas
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Springer US 2020
Konular:
Nano Express
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC7248167/
https://ncbi.nlm.nih.gov/pubmed/32451638
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-020-03349-2
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