Atomic-Resolution EDX, HAADF, and EELS Study of GaAs(1-x)Bi(x) Alloys

The distribution of alloyed atoms in semiconductors often deviates from a random distribution which can have significant effects on the properties of the materials. In this study, scanning transmission electron microscopy techniques are employed to analyze the distribution of Bi in several distinctl...

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Detalhes bibliográficos
Publicado no:Nanoscale Res Lett
Main Authors: Paulauskas, Tadas, Pačebutas, Vaidas, Butkutė, Renata, Čechavičius, Bronislovas, Naujokaitis, Arnas, Kamarauskas, Mindaugas, Skapas, Martynas, Devenson, Jan, Čaplovičová, Mária, Vretenár, Viliam, Li, Xiaoyan, Kociak, Mathieu, Krotkus, Arūnas
Formato: Artigo
Idioma:Inglês
Publicado em: Springer US 2020
Assuntos:
Nano Express
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7248167/
https://ncbi.nlm.nih.gov/pubmed/32451638
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-020-03349-2
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