Atomic-Resolution EDX, HAADF, and EELS Study of GaAs(1-x)Bi(x) Alloys

The distribution of alloyed atoms in semiconductors often deviates from a random distribution which can have significant effects on the properties of the materials. In this study, scanning transmission electron microscopy techniques are employed to analyze the distribution of Bi in several distinctl...

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Bibliographic Details
Published in:Nanoscale Res Lett
Main Authors: Paulauskas, Tadas, Pačebutas, Vaidas, Butkutė, Renata, Čechavičius, Bronislovas, Naujokaitis, Arnas, Kamarauskas, Mindaugas, Skapas, Martynas, Devenson, Jan, Čaplovičová, Mária, Vretenár, Viliam, Li, Xiaoyan, Kociak, Mathieu, Krotkus, Arūnas
Format: Artigo
Language:Inglês
Published: Springer US 2020
Subjects:
Nano Express
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC7248167/
https://ncbi.nlm.nih.gov/pubmed/32451638
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-020-03349-2
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