Atomic-Resolution EDX, HAADF, and EELS Study of GaAs(1-x)Bi(x) Alloys

The distribution of alloyed atoms in semiconductors often deviates from a random distribution which can have significant effects on the properties of the materials. In this study, scanning transmission electron microscopy techniques are employed to analyze the distribution of Bi in several distinctl...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Nanoscale Res Lett
Egile Nagusiak: Paulauskas, Tadas, Pačebutas, Vaidas, Butkutė, Renata, Čechavičius, Bronislovas, Naujokaitis, Arnas, Kamarauskas, Mindaugas, Skapas, Martynas, Devenson, Jan, Čaplovičová, Mária, Vretenár, Viliam, Li, Xiaoyan, Kociak, Mathieu, Krotkus, Arūnas
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer US 2020
Gaiak:
Nano Express
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC7248167/
https://ncbi.nlm.nih.gov/pubmed/32451638
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-020-03349-2
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