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The Study of Deep Level Traps and Their Influence on Current Characteristics of InP/InGaAs Heterostructures

The damage mechanism of proton irradiation in InP/InGaAs heterostructures was studied. The deep level traps were investigated in detail by deep level transient spectroscopy (DLTS), capacitance–voltage (C–V) measurements and SRIM (the stopping and range of ions in matter, Monte Carlo code) simulation...

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Detalhes bibliográficos
Publicado no:Nanomaterials (Basel)
Main Authors: Zhao, Xiaohong, Lu, Hongliang, Zhao, Manli, Zhang, Yuming, Zhang, Yimen
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6722908/
https://ncbi.nlm.nih.gov/pubmed/31395830
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano9081141
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