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Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling

BACKGROUND: CUT&RUN is an efficient epigenome profiling method that identifies sites of DNA binding protein enrichment genome-wide with high signal to noise and low sequencing requirements. Currently, the analysis of CUT&RUN data is complicated by its exceptionally low background, which rend...

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Dades bibliogràfiques
Publicat a:Epigenetics Chromatin
Autors principals: Meers, Michael P., Tenenbaum, Dan, Henikoff, Steven
Format: Artigo
Idioma:Inglês
Publicat: BioMed Central 2019
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC6624997/
https://ncbi.nlm.nih.gov/pubmed/31300027
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s13072-019-0287-4
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