Cargando...

Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling

BACKGROUND: CUT&RUN is an efficient epigenome profiling method that identifies sites of DNA binding protein enrichment genome-wide with high signal to noise and low sequencing requirements. Currently, the analysis of CUT&RUN data is complicated by its exceptionally low background, which rend...

Descripción completa

Guardado en:
Detalles Bibliográficos
Publicado en:Epigenetics Chromatin
Autores principales: Meers, Michael P., Tenenbaum, Dan, Henikoff, Steven
Formato: Artigo
Lenguaje:Inglês
Publicado: BioMed Central 2019
Materias:
Acceso en línea:https://ncbi.nlm.nih.gov/pmc/articles/PMC6624997/
https://ncbi.nlm.nih.gov/pubmed/31300027
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s13072-019-0287-4
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!