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Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling
BACKGROUND: CUT&RUN is an efficient epigenome profiling method that identifies sites of DNA binding protein enrichment genome-wide with high signal to noise and low sequencing requirements. Currently, the analysis of CUT&RUN data is complicated by its exceptionally low background, which rend...
שמור ב:
| הוצא לאור ב: | Epigenetics Chromatin |
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| Main Authors: | , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
BioMed Central
2019
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6624997/ https://ncbi.nlm.nih.gov/pubmed/31300027 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s13072-019-0287-4 |
| תגים: |
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