Subnanometer localization accuracy in widefield optical microscopy

The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue—overconfidence in measurement results with nanoscale statistical uncertainties that can be invalid due to mi...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Light Sci Appl
Prif Awduron: Copeland, Craig R., Geist, Jon, McGray, Craig D., Aksyuk, Vladimir A., Liddle, J. Alexander, Ilic, B. Robert, Stavis, Samuel M.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: Nature Publishing Group UK 2018
Pynciau:
Article
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC6107003/
https://ncbi.nlm.nih.gov/pubmed/30839614
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41377-018-0031-z
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