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Copeland, Craig R., Jon Geist, Craig D. McGray, Vladimir A. Aksyuk, J. Alexander Liddle, B. Robert Ilic, and Samuel M. Stavis. "Subnanometer Localization Accuracy in Widefield Optical Microscopy." Light Sci Appl 2018.

Copeland, Craig R., et al. "Subnanometer Localization Accuracy in Widefield Optical Microscopy." Light Sci Appl 2018.