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Accurate localization microscopy by intrinsic aberration calibration

A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard paradigm, introducing the concept of fully ex...

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Detalhes bibliográficos
Publicado no:Nat Commun
Main Authors: Copeland, Craig R., McGray, Craig D., Ilic, B. Robert, Geist, Jon, Stavis, Samuel M.
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8225824/
https://ncbi.nlm.nih.gov/pubmed/34168121
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-021-23419-y
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