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Accurate localization microscopy by intrinsic aberration calibration

A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard paradigm, introducing the concept of fully ex...

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Publicat a:Nat Commun
Autors principals: Copeland, Craig R., McGray, Craig D., Ilic, B. Robert, Geist, Jon, Stavis, Samuel M.
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group UK 2021
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Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC8225824/
https://ncbi.nlm.nih.gov/pubmed/34168121
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-021-23419-y
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