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Particle Tracking of Microelectromechanical System Performance and Reliability

Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions exhibit limits to their performance and reliability. Here, we advance our particle tracking method to measure MEMS motion in operando at nanometer, microradian, and millisecond scales. We test a...

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Bibliografische gegevens
Gepubliceerd in:J Microelectromech Syst
Hoofdauteurs: Copeland, Craig R., McGray, Craig D., Geist, Jon, Stavis, Samuel M.
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: 2018
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6512989/
https://ncbi.nlm.nih.gov/pubmed/31093003
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/JMEMS.2018.2874771
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