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Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging
We develop an algorithm for feature extraction based on structural similarity and demonstrate its application for atom and pattern finding in high-resolution electron and scanning probe microscopy images. The use of the combined local identifiers formed from an image subset and appended Fourier, or...
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| Publicat a: | Adv Struct Chem Imaging |
|---|---|
| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Springer International Publishing
2018
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5846807/ https://ncbi.nlm.nih.gov/pubmed/29568723 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-018-0052-y |
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