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Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates fr...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5341089/ https://ncbi.nlm.nih.gov/pubmed/28272404 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep43585 |
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